METTLER TOLEDO will host an Educational Center at the upcoming 2015 Process Expo in Chicago, September 15-18. A leader in providing in line and static checkweighing, metal detection, X-ray inspection and machine vision inspection technologies worldwide for food and pharmaceutical manufacturers, METTLER TOLEDO has invited experts from BRC, SQF, IFS, and FSSC22000 to join food safety experts from METTLER TOLEDO to discuss their latest updates and address a wide range of other food safety topics. Presentations will be open to all attendees at Process Expo 2015.
The Educational Center will be located in Booth 5845 in North Hall at McCormick Place. Topics to be discussed will include sanitary equipment design, label mixup detection and prevention, product traceability and overall inspection system connectivity. Other presentations will cover maximizing OEE in food processing operations, improving metal detection in challenging and using X-Ray inspection as a Critical Control Point (CCP). A complete schedule of presentations is available at www.mt.com/pius-mtedu
Process Expo attendees are also invited to visit the adjacent METTLER TOLEDO booth (N6043) in North Hall, where a variety of inspection systems will be demonstrated.
For more information, visit www.mt.com/pi.